| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Benjamin M. Dawson, Stephen S. Wilson, Frederick Y. Wu |
| Title | Machine Vision Applications in Industrial Inspection II: 8-9 February 1994, San Jose, California |
| Publisher | SPIE Optical Engineering Press |
| Year | 1994 |
| Languages | eng |
| Isbn | 0819414786 |
| Series | SPIE Proceedings |
| Volume | 2183 |
| Issn | 99-0108644 |
| Description | 336 s. |
| Record date | 20100813 |
| Location | Bellingham, Wash., USA |
| Keywords | Three-dimensional imaging, Real time tracking, Industrial inspection, Seende datorer, Computer vision, Materialdefekter, Defects in materials, Optisk avsökning (Bildbehandling), Optical scanning (Image processing), Konferenspublikationer, Conference proceedings |