| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Editors: Charles J. Hailey, Oswald H. W. Siegmund |
| Title | EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy and Atomic Physics: 7-11 August 1989, San Diego, California |
| Publisher | SPIE - The International Society for Optical Engineering |
| Year | 1989 |
| Languages | eng |
| Isbn | 0819401951 |
| Series | SPIE Proceedings |
| Volume | 1159 |
| Description | x, 680 p. ill. 28 cm. |
| Record date | 20130907 |
| Location | Bellingham, Wash. |