Shelfclass_id | S/SPIE |
Sortkey | S/SPIE |
Authors | David B. Chenault, Michael J. Duggin, Walter G. Egan, Dennis H. Goldstein |
Title | Polarization Analysis, Measurement, and Remote Sensing III: 2-4 August 2000, San Diego, USA |
Publisher | SPIE Optical Engineering Press |
Year | 2000 |
Languages | eng |
Isbn | 0819437786 |
Series | SPIE Proceedings |
Volume | 4133 |
Issn | 99-0108644 |
Description | 302 s. |
Record date | 20100820 |
Location | Bellingham, Wash., USA |