| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Fernando Luis Podio |
| Title | Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks: 21-22 July 1999, Denver, Colorado |
| Publisher | SPIE Optical Engineering Press |
| Year | 1999 |
| Languages | eng |
| Isbn | 081943292X |
| Series | SPIE Proceedings |
| Volume | 3806 |
| Description | 182 s. |
| Record date | 20090805 |
| Location | Bellingham, Wash., USA |