Shelfclass_id | S/SPIE |
Sortkey | S/SPIE |
Authors | Orest J. Glembocki |
Title | Spectroscopic Characterization Techniques for Semiconductor Technology V: 25-26 January 1994, Los Angeles, California |
Publisher | SPIE Optical Engineering Press |
Year | 1994 |
Languages | eng |
Isbn | 0819414360 |
Series | SPIE Proceedings |
Volume | 2141 |
Description | 220 s. |
Record date | 20090724 |
Location | Bellingham, Wash., USA |
Keywords | Semiconductor devices, Quantum well devices, Quantum well materials, Epitaxial growth, Quantum dots, Quantum wires, Spektrokemisk analys, Spectrochemical analysis, Halvledarteknik, Semiconductor engineering, Konferenspublikationer, Conference proceedings |