| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Orest J. Glembocki |
| Title | Spectroscopic Characterization Techniques for Semiconductor Technology V: 25-26 January 1994, Los Angeles, California |
| Publisher | SPIE Optical Engineering Press |
| Year | 1994 |
| Languages | eng |
| Isbn | 0819414360 |
| Series | SPIE Proceedings |
| Volume | 2141 |
| Description | 220 s. |
| Record date | 20090724 |
| Location | Bellingham, Wash., USA |
| Keywords | Semiconductor devices, Quantum well devices, Quantum well materials, Epitaxial growth, Quantum dots, Quantum wires, Spektrokemisk analys, Spectrochemical analysis, Halvledarteknik, Semiconductor engineering, Konferenspublikationer, Conference proceedings |