| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Kenneth W. Tobin, Ning S. Chang |
| Title | Machine Vision Applications in Industrial Inspection VII: 25-26 January 1999, San Jose, California |
| Publisher | SPIE Optical Engineering Press |
| Year | 1999 |
| Languages | eng |
| Isbn | 0819431230 |
| Series | SPIE Proceedings |
| Volume | 3652 |
| Issn | 99-0108644 |
| Description | 262 s. |
| Record date | 20100818 |
| Location | Bellingham, Wash., USA |