| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Editor: Eberhard Spiller |
| Title | High Resolution Soft X-Ray Optics: November 18-20, 1981, Brookhaven, New York |
| Publisher | SPIE - The International Society for Optical Engineering |
| Year | 1982 |
| Languages | eng |
| Isbn | 0892523506 |
| Series | SPIE Proceedings |
| Volume | 316 |
| Description | viii, 216 p. 28 cm. |
| Record date | 20130826 |
| Location | Bellingham, Wash. |