| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Oswald H. Siegmund, Richard E. Rothschild |
| Title | EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy II: 24-26 July 1991, San Diego, California |
| Publisher | SPIE - The International Society for Optical Engineering |
| Year | 1991 |
| Languages | eng |
| Isbn | 0819406775 |
| Series | SPIE Proceedings |
| Volume | 1549 |
| Description | ix, 440 s. ill., diagr., tab. |
| Record date | 20090721 |
| Location | Bellingham, Wash. |
| Keywords | Ultraviolet spectroscopy, Astronomiska instrument, Astronomical instruments, Gammaspektroskopi, Gamma-ray spectroscopy, Röntgenspektroskopi, X-ray spectroscopy, Konferenspublikationer, Conference proceedings |