| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Donald J. Svetkoff |
| Title | Imaging and Illumination for Metrology and Inspection: 2-4 November 1994, Boston, Massachusetts |
| Publisher | SPIE Optical Engineering Press |
| Year | 1995 |
| Languages | eng |
| Isbn | 0819416835 |
| Series | SPIE Proceedings |
| Volume | 2348 |
| Issn | 99-0108644 |
| Description | 276 s. |
| Record date | 20100813 |
| Location | Bellingham, Wash., USA |
| Keywords | Avsyning (Teknik), Engineering inspection, Metrologi, Metrology, Tillämpad optik, Applied optics, Konferenspublikationer, Conference proceedings |