| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Michel Grosmann, Patrick Meyrueis |
| Title | 2nd European Congress on Optics Applied to Metrology (METROP): Presented as Part of the Optics, Photonics, and Iconics Engineering Meeting (OPIEM): November 26-30, 1979, Strasbourg, France |
| Publisher | SPIE Optical Engineering Press |
| Year | 1980 |
| Languages | eng |
| Isbn | 0892522380 |
| Series | SPIE Proceedings |
| Volume | 210 |
| Description | x, 228 p. ill. 28 cm. |
| Record date | 20090716 |
| Location | Bellingham, Wash. |
| Keywords | Optical measurements, Holographic interferometry, Speckle metrology |