| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Philip T. C. Chen, O. Manuel Uy |
| Title | Optical Systems Contamination and Degradation II: Effects, Measurements, and Control: 2-3 August 2000, San Diego, USA |
| Publisher | SPIE Optical Engineering Press |
| Year | 2000 |
| Languages | eng |
| Isbn | 0819437417 |
| Series | SPIE Proceedings |
| Volume | 4096 |
| Issn | 99-0108644 |
| Description | 204 s. |
| Record date | 20100819 |
| Location | Bellingham, Wash., USA |