| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Robert R. Alfano |
| Title | Ultrafast Laser Probe Phenomena in Bulk and Microstructure Semiconductors III: 18-19 March 1990, San Diego, California |
| Publisher | SPIE Optical Engineering Press |
| Year | 1990 |
| Languages | eng |
| Isbn | 0819403334 |
| Series | SPIE Proceedings |
| Volume | 1282 |
| Description | 213 s. |
| Record date | 20090720 |
| Location | Bellingham, Wash., USA |
| Keywords | Halvledare, Semiconductors, Konferenspublikationer, Conference proceedings |