| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Sergey V. Svechnikov, Mikhail Ya. Valakh |
| Title | International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics: 11-13 May 1995, Kiev, Ukraine |
| Publisher | SPIE Optical Engineering Press |
| Year | 1995 |
| Languages | eng |
| Isbn | 0819420212 |
| Series | SPIE Proceedings |
| Volume | 2648 |
| Description | xv, 768 s. |
| Record date | 20090728 |
| Location | Bellingham, Wash., USA |
| Keywords | Absorption spectroscopy, Reflection spectroscopy, Interferometry, Nonlinear optics, Optical spectroscopy, Raman scattering, Optiska metoder (Icke-förstörande materialprovning), Optical methods (Non-destructive testing of materials), Konferenspublikationer, Conference proceedings |