| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Michael R. Descour, Jonathan M. Mooney |
| Title | Imaging Spectrometry II: 7-8 August 1996, Denver, Colorado |
| Publisher | SPIE Optical Engineering Press |
| Year | 1996 |
| Languages | eng |
| Isbn | 081942207X |
| Series | SPIE Proceedings |
| Volume | 2819 |
| Issn | 99-0108644 |
| Description | 356 s. |
| Record date | 20100817 |
| Location | Bellingham, Wash., USA |
| Keywords | Teknisk optik, Applied optics |