| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Dennis H. Goldstein, David B. Chenault, Walter G. Egan, Michael J. Duggin |
| Title | Polarization Analysis, Measurement and Remote Sensing IV: 29-31 July 2001, San Diego, USA |
| Publisher | SPIE Optical Engineering Press |
| Year | 2002 |
| Languages | eng |
| Isbn | 0819441953 |
| Series | SPIE Proceedings |
| Volume | 4481 |
| Issn | 99-0108644 |
| Description | 324 s. |
| Record date | 20100820 |
| Location | Bellingham, Wash., USA |