Shelfclass_id | S/SPIE |
Sortkey | S/SPIE |
Authors | Alan M. Frank, James S. Walton |
Title | High-Speed Imaging and Seguence Analysis II: 27 January 2000, San Jose, California |
Publisher | SPIE Optical Engineering Press |
Year | 2000 |
Languages | eng |
Isbn | 0819435864 |
Series | SPIE Proceedings |
Volume | 3968 |
Description | 154 s. |
Record date | 20090807 |
Location | Bellingham, Wash., USA |