| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Editors: John Nestler, Philip I. Richardson |
| Title | Automated Testing of Electro-Optical Systems: 7-8 April 1988, Orlando, Florida |
| Publisher | SPIE - The International Society for Optical Engineering |
| Year | 1988 |
| Languages | eng |
| Isbn | 0892529768 |
| Series | SPIE Proceedings |
| Volume | 941 |
| Description | vi, 106 p. ill. 28 cm. |
| Record date | 20130902 |
| Location | Bellingham, Wash. |