| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Silvano Fineschi |
| Title | X-Ray and Ultraviolet Spectroscopy and Polarimetry II: 23-24 July 1998, San Diego, California |
| Publisher | SPIE Optical Engineering Press |
| Year | 1998 |
| Languages | eng |
| Isbn | 0819428981 |
| Series | SPIE Proceedings |
| Volume | 3443 |
| Description | 160 s. |
| Record date | 20090803 |
| Location | Bellingham, Wash., USA |