| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Russell A. Chipman, John W. Morris |
| Title | Polarimetry: Radar, Infrared, Visible, Ultraviolet and X-Ray: 15-17 May 1990, Huntsville, Alabama |
| Publisher | SPIE Optical Engineering Press |
| Year | 1990 |
| Languages | eng |
| Isbn | 0819403725 |
| Series | SPIE Proceedings |
| Volume | 1317 |
| Description | 449 s. |
| Record date | 20090720 |
| Location | Bellingham, Wash., USA |
| Keywords | Mätteknik (Polarisation), Measurements (Polarization), Konferenspublikationer, Conference proceedings |