| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | John Hicks, Peter R. De Forest, Vivian M. Baylor |
| Title | Forensic Evidence Analysis and Crime Scene Investigation: 20-21 November 1996, Boston, Massachusetts |
| Publisher | SPIE Optical Engineering Press |
| Year | 1997 |
| Languages | eng |
| Isbn | 0819423432 |
| Series | SPIE Proceedings |
| Volume | 2941 |
| Issn | 99-0108644 |
| Description | 148 s. |
| Record date | 20100817 |
| Location | Bellingham, Wash., USA |