| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Michel Piché |
| Title | Advances in Optical Beam Characterization and Measurements: 14 July 1998, Québec, Canada |
| Publisher | SPIE Optical Engineering Press |
| Year | 1998 |
| Languages | eng |
| Isbn | 0819428728 |
| Series | SPIE Proceedings |
| Volume | 3418 |
| Description | 128 s. |
| Record date | 20090801 |
| Location | Bellingham, Wash., USA |