Shelfclass_id | S/SPIE |
Sortkey | S/SPIE |
Authors | Michel Piché |
Title | Advances in Optical Beam Characterization and Measurements: 14 July 1998, Québec, Canada |
Publisher | SPIE Optical Engineering Press |
Year | 1998 |
Languages | eng |
Isbn | 0819428728 |
Series | SPIE Proceedings |
Volume | 3418 |
Description | 128 s. |
Record date | 20090801 |
Location | Bellingham, Wash., USA |