| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Gopal Rao, Massimo Piccoli |
| Title | Microelectronic Manufacturing Yield, Reliability, and Failure Analysis: 25-26 October 1995, Austin, Texas |
| Publisher | SPIE Optical Engineering Press |
| Year | 1995 |
| Languages | eng |
| Isbn | 0819420018 |
| Series | SPIE Proceedings |
| Volume | 2635 |
| Issn | 99-0108644 |
| Description | 284 s. |
| Record date | 20100816 |
| Location | Bellingham, Wash., USA |
| Keywords | Reliability, Mikroelektronik, Microelectronics, Konferenspublikationer, Conference proceedings |