| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | William S. Chan, John T. Hall |
| Title | Focal Plane Methodologies III |
| Publisher | SPIE - The International Society for Optical Engineering |
| Year | 1983 |
| Languages | eng |
| Isbn | 0892523859 |
| Series | SPIE Proceedings |
| Volume | 350 |
| Description | vi, 130 p. ill. 28 cm. |
| Record date | 20090717 |
| Location | Bellingham, Wash. USA |
| Keywords | Infrared technology, Signal processing |
| Notes | Proceedings of a meeting held Aug. 24-25, 1982, San Diego, Calif. |