| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Editors: Richard A. Brook, Michael J. W. Chen |
| Title | International Conference on Automatic Inspection and Measurement: August 20-21, 1985, San Diego, California |
| Publisher | SPIE - The International Society for Optical Engineering |
| Year | 1985 |
| Languages | eng |
| Isbn | 0892525924 |
| Series | SPIE Proceedings |
| Volume | 557 |
| Description | vi, 176 p. 28 cm. |
| Record date | 20131005 |
| Location | Bellingham, Wash. |