| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Randolph E. Longshore, John M. Trombetta, Jan W. Baars, Avishai Kepten |
| Title | Growth and Characterization of Materials for Infrared Detectors II: 13-14 July 1995, San Diego, California |
| Publisher | SPIE Optical Engineering Press |
| Year | 1995 |
| Languages | eng |
| Isbn | 0819419133 |
| Series | SPIE Proceedings |
| Volume | 2554 |
| Description | 296 s. |
| Record date | 20090728 |
| Location | Bellingham, Wash., USA |
| Keywords | Detector materials, Infrared materials, IR materials, Optical materials, Infraröddetektorer, Infrared detectors, Konferenspublikationer, Conference proceedings |