Shelfclass_id | S/SPIE |
Sortkey | S/SPIE |
Authors | C. P. Grover |
Title | Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection: Part 2/2: 8-13 July 1990, San Diego, California |
Publisher | SPIE Optical Engineering Press |
Year | 1990 |
Languages | eng |
Isbn | 0819403938 |
Series | SPIE Proceedings |
Volume | 1332:2/2 |
Issn | 99-0108644 |
Description | 2 vol. ill. |
Record date | 20100810 |
Location | Bellingham, Wash., USA |
Keywords | Holography, Interferometry, Provning och mätteknik, Testing and measurements (Engineering), Teknisk optik, Applied optics, Konferenspublikationer, Conference proceedings |