| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | C. P. Grover |
| Title | Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection: Part 2/2: 8-13 July 1990, San Diego, California |
| Publisher | SPIE Optical Engineering Press |
| Year | 1990 |
| Languages | eng |
| Isbn | 0819403938 |
| Series | SPIE Proceedings |
| Volume | 1332:2/2 |
| Issn | 99-0108644 |
| Description | 2 vol. ill. |
| Record date | 20100810 |
| Location | Bellingham, Wash., USA |
| Keywords | Holography, Interferometry, Provning och mätteknik, Testing and measurements (Engineering), Teknisk optik, Applied optics, Konferenspublikationer, Conference proceedings |