| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | David P. Casasent, Tien-Hsin Chao |
| Title | Optical Pattern Recognition III: 21-22 April 1992, Orlando, Florida |
| Publisher | SPIE Optical Engineering Press |
| Year | 1992 |
| Languages | eng |
| Isbn | 0819408662 |
| Series | SPIE Proceedings |
| Volume | 1701 |
| Issn | 99-0108644 |
| Description | 325 s. |
| Record date | 20100810 |
| Location | Bellingham, Wash., USA |
| Keywords | Optical neural networks, Optisk mönsteridentifiering, Optical pattern recognition, Konferenspublikationer, Conference proceedings |