| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Frederick Y. Wu, Benjamin M. Dawson |
| Title | Machine Vision Applications in Industrial Inspection: 3-4 February 1993, San Jose, California |
| Publisher | SPIE Optical Engineering Press |
| Year | 1993 |
| Languages | eng |
| Isbn | 081941140X |
| Series | SPIE Proceedings |
| Volume | 1907 |
| Issn | 99-0108644 |
| Description | 272 s. |
| Record date | 20100813 |
| Location | Bellingham, Wash., USA |
| Keywords | Scanning probe microscopy, SXM, Scanning tunneling microscopy, STM, Industrial inspection, Seende datorer, Computer vision, Materialdefekter, Defects in materials, Optisk avsökning (Bildbehandling), Optical scanning (Image processing), Konferenspublikationer, Conference proceedings |