| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Editors: Michael J. W. Chen, Robert Thibadeau |
| Title | Automated Inspection and Measurement: 28-30 October 1986, Cambridge, Massachusetts |
| Publisher | SPIE - The International Society for Optical Engineering |
| Year | 1987 |
| Languages | eng |
| Isbn | 089252765X |
| Series | SPIE Proceedings |
| Volume | 730 |
| Description | vi, 256 p. ill. 28 cm. |
| Record date | 20130901 |
| Location | Bellingham, Wash. |