| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Edward F. Kelley, Tolis Voutsas |
| Title | Flat Panel Display Technology and Display Metrology II: 22-23 January 2001, San Jose, USA |
| Publisher | Spie |
| Year | 2001 |
| Languages | eng |
| Isbn | 0819439738 |
| Series | SPIE Proceedings |
| Volume | 4295 |
| Issn | 1047-9899 |
| Description | ix, 290 p. ill. 28 cm. |
| Record date | 20100820 |
| Location | Bellingham, Washington |
| Nlmed | TK7882.I6 |
| Keywords | Information display systems, Optical measurements |