| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Editor: C. P. Grover |
| Title | Optical Testing and Metrology II: 27-30 June 2988, Dearborn, Michigan |
| Publisher | SPIE - The International Society for Optical Engineering |
| Year | 1989 |
| Languages | eng |
| Isbn | 089252989X |
| Series | SPIE Proceedings |
| Volume | 954 |
| Description | viii, 725 p. ill. 28 cm. |
| Record date | 20130902 |
| Location | Bellingham, Wash. |