| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Editor: Peter Langenbeck |
| Title | In-Process Optical Metrology for Precision Machining: 31 March-2 April 1987, The Hague, The Netherlands |
| Publisher | SPIE - The International Society for Optical Engineering |
| Year | 1987 |
| Languages | eng |
| Isbn | 0892528370 |
| Series | SPIE Proceedings |
| Volume | 802 |
| Description | viii, 217 p. ill. 28 cm. |
| Record date | 20130901 |
| Location | Bellingham, Wash. |