| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Editros: John C. Urbach, Byron Brenden, Robert Aprahamian |
| Title | Imaging Techniques for Testing and Inspection: Seminar-in-Depth: February 1972, Los Angeles, California |
| Publisher | SPIE - The International Society for Optical Engineering |
| Year | 1972 |
| Languages | eng |
| Series | SPIE Proceedings |
| Volume | 29 |
| Description | viii, 148 p. 28 cm. |
| Record date | 20131005 |
| Location | Bellingham, Wash. |
| Notes | Reprint 1973, Hardcover |