| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | János A. Bergou, Janusz M. Smulko, Mark I. Dykman, Lijun Wang |
| Title | Noise and Information in Nanoelectronics, Sensors, and Standards III: 24-26 May 2005, Austin, Texas, USA |
| Publisher | Spie |
| Year | 2005 |
| Languages | eng |
| Isbn | 0819458414 |
| Series | SPIE Proceedings |
| Volume | 5846 |
| Description | xxiv, 210 p. ill. 28 cm. |
| Record date | 20090902 |
| Location | Bellingham, Wash. |
| Keywords | Noise, Noise control, Nanotechnology, Information technology, Detectors |
| Urlnote | Table of contents only |
| Urls | http://www.loc.gov/catdir/toc/fy0611/2006530682.html |