| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Aland K. Chin, Niloy K. Dutta, Robert W. Herrick, Kurt J. Linden, Daniel J. McGrav |
| Title | Test and Measurement Applications of Optoelectronic Devices: 21-22 January 2002, San Jose, USA |
| Publisher | SPIE Optical Engineering Press |
| Year | 2002 |
| Languages | eng |
| Isbn | 0819443875 |
| Series | SPIE Proceedings |
| Volume | 4648 |
| Issn | 99-0108644 |
| Description | 180 s. |
| Record date | 20100821 |
| Location | Bellingham, Wash., USA |