| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Iraj Emami, Christopher P. Ausschnitt, Kenneth W. Tobin Jr. |
| Title | Data Analysis and Modeling for Process Control II: 3-4 March 2005, San Jose, California, USA |
| Publisher | Spie |
| Year | 2005 |
| Languages | eng |
| Isbn | 0819457353 |
| Series | SPIE Proceedings |
| Volume | 5755 |
| Description | xxxiii, 260 p. ill. 28 cm. |
| Record date | 20090902 |
| Location | Bellingham, Wash. |
| Keywords | Manufacturing processes, Intelligent control systems, Process control |