Shelfclass_id | S/SPIE |
Sortkey | S/SPIE |
Authors | Zu-Han Gu, Alexei A. Maradudin |
Title | Scattering and Surface Roughness III: 1-2 August 2000, San Diego, USA |
Publisher | SPIE Optical Engineering Press |
Year | 2000 |
Languages | eng |
Isbn | 081943745X |
Series | SPIE Proceedings |
Volume | 4100 |
Description | 222 s. |
Record date | 20090819 |
Location | Bellingham, Wash., USA |