International Conference on Photomechanics and Speckle Metrology: Part One of Two Parts: 17-20 August 1987, San Diego, California

Shelfclass_id S/SPIE
Sortkey S/SPIE
Authors Editor: Fu-Pen Chiang
Title International Conference on Photomechanics and Speckle Metrology: Part One of Two Parts: 17-20 August 1987, San Diego, California
Publisher SPIE - The International Society for Optical Engineering
Year 1988
Languages eng
Isbn 0892528494
Series SPIE Proceedings
Volume 814:1/2
Description x, 403 p. ill. 28 cm.
Record date 20130901
Location Bellingham, Wash.