| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Silvano Fineschi |
| Title | X-Ray and EUV/FUV Spectroscopy and Polarimetry: 11-12 July 1995, San Diego, California |
| Publisher | SPIE Optical Engineering Press |
| Year | 1995 |
| Languages | eng |
| Isbn | 0819418765 |
| Series | SPIE Proceedings |
| Volume | 2517 |
| Description | 284 s. |
| Record date | 20090728 |
| Location | Bellingham, Wash., USA |
| Keywords | Ultraviolet spectroscopy, Röntgenspektroskopi, X-ray spectroscopy, Konferenspublikationer, Conference proceedings |