| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Chris J. Jacobsen, James E. Trebes |
| Title | Soft X-Ray Microscopy: 19-21 July 1992, San Diego, California |
| Publisher | SPIE Optical Engineering Press |
| Year | 1993 |
| Languages | eng |
| Isbn | 0819409146 |
| Series | SPIE Proceedings |
| Volume | 1741 |
| Description | 412 s. |
| Record date | 20090722 |
| Location | Bellingham, Wash., USA |
| Keywords | X-ray microscopy, Mikroskopi, Microscopy, Konferenspublikationer, Conference proceedings |