Shelfclass_id | S/SPIE |
Sortkey | S/SPIE |
Authors | Editors: Sergei V. Svechnikov, Mikhail Ya. Valakh |
Title | International Workshop on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics: 6-7 May 1993, Kiev, Ukraine |
Publisher | SPIE - The International Society for Optical Engineering |
Year | 1994 |
Languages | eng |
Isbn | 0819414069 |
Series | SPIE Proceedings |
Volume | 2113 |
Description | ix, 252 p. ill. 28 cm. |
Record date | 20130908 |
Location | Bellingham, Wash. |