| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Editors: Sergei V. Svechnikov, Mikhail Ya. Valakh |
| Title | International Workshop on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics: 6-7 May 1993, Kiev, Ukraine |
| Publisher | SPIE - The International Society for Optical Engineering |
| Year | 1994 |
| Languages | eng |
| Isbn | 0819414069 |
| Series | SPIE Proceedings |
| Volume | 2113 |
| Description | ix, 252 p. ill. 28 cm. |
| Record date | 20130908 |
| Location | Bellingham, Wash. |