Shelfclass_id | S/SPIE |
Sortkey | S/SPIE |
Authors | John C. Stover |
Title | Optical Scattering: Applications, Measurement, and Theory II: 15-16 July 1993, San Diego, California |
Publisher | SPIE Optical Engineering Press |
Year | 1993 |
Languages | eng |
Isbn | 0819412449 |
Series | SPIE Proceedings |
Volume | 1995 |
Description | 302 s. |
Record date | 20090724 |
Location | Bellingham, Wash., USA |
Keywords | Scatterometers, Reflectometers, Surface scatter, Bidirectional scatter distribution function, BRDF, Reflexion (Optik), Reflection (Optics), Ljusets spridning, Scattering of light, Konferenspublikationer, Conference proceedings |