| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | A. Peter Glassford |
| Title | Optical System Contamination: Effects, Measurement, Control II: 10-12 July 1990, San Diego, California |
| Publisher | SPIE Optical Engineering Press |
| Year | 1990 |
| Languages | eng |
| Isbn | 0819403903 |
| Series | SPIE Proceedings |
| Volume | 1329 |
| Description | 383 s. |
| Record date | 20090826 |
| Location | Bellingham, Wash., USA |
| Keywords | Teknisk optik, Applied optics, Konferenspublikationer, Conference proceedings |