| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Michael A. Paesler, Patrick J. Moyer |
| Title | Near-Field Optics: 9-10 July 1995, San Diego, California |
| Publisher | SPIE Optical Engineering Press |
| Year | 1995 |
| Languages | eng |
| Isbn | 0819418943 |
| Series | SPIE Proceedings |
| Volume | 2535 |
| Issn | 99-0108644 |
| Description | 162 s. |
| Record date | 20100813 |
| Location | Bellingham, Wash., USA |
| Keywords | Near-field scanning microscopy, Mikroskopi, Microscopy, Konfenspublikationer, Conference proceedings |