| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | David L. Andrews, Toshimitsu Asakura, Suganda Jutamulia, Wiley P. Kirk, Max G. Lagally, Ravindra B. Lal, James D. Trolinger |
| Title | Optical Devices and Diagnostics in Materials Science: 1-4 August 2000, San Diego, USA |
| Publisher | Spie |
| Year | 2000 |
| Languages | eng |
| Isbn | 0819437433 |
| Series | SPIE Proceedings |
| Volume | 4098 |
| Issn | 99-0108644 |
| Description | viii, 314 p. ill. 28 cm. |
| Record date | 20100819 |
| Location | Bellingham, Wash., USA |
| Nlmed | TA418.9.N35 |
| Keywords | Nanostructured materials, Optical materials, Optoelectronic devices, Light, Near-field microscopy, Raman spectroscopy, Diagnostic imaging |