| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Editor: R. R. Alfano |
| Title | Ultrafast Lasers Probe Phenomena in Bulk and Microstructure Semiconductors: 25-26 March 1987, Bay Point, Florida |
| Publisher | SPIE - The International Society for Optical Engineering |
| Year | 1987 |
| Languages | eng |
| Isbn | 0892528281 |
| Series | SPIE Proceedings |
| Volume | 793 |
| Description | vi, 194 p. ill. 28 cm. |
| Record date | 20130901 |
| Location | Bellingham, Wash. |