| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Silvano Fineschi, Bruce E. Woodgate, Randy A. Kimble |
| Title | Ultraviolet and X-Ray Detection, Spectroscopy, and Polarimetry III: 19-20 July 1999, Denver, Colorado |
| Publisher | SPIE Optical Engineering Press |
| Year | 1999 |
| Languages | eng |
| Isbn | 0819432504 |
| Series | SPIE Proceedings |
| Volume | 3764 |
| Description | 288 s. |
| Record date | 20090805 |
| Location | Bellingham, Wash., USA |