| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Robert Lee Murrer Jr. |
| Title | Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VII: 1-2 April 2002, Orlando, USA |
| Publisher | SPIE Optical Engineering Press |
| Year | 2002 |
| Languages | eng |
| Isbn | 0819444677 |
| Series | SPIE Proceedings |
| Volume | 4717 |
| Issn | 99-0108644 |
| Description | 218 s. |
| Record date | 20100823 |
| Location | Bellingham, Wash., USA |