| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Harvey L. Kasdan |
| Title | Optics in Metrology and Quality Assurance: February 6-7, 1980, Los Angeles, California |
| Publisher | SPIE Optical Engineering Press |
| Year | 1980 |
| Languages | eng |
| Isbn | 0892522488 |
| Series | SPIE Proceedings |
| Volume | 220 |
| Description | vi, 196 p. ill. 28 cm. |
| Record date | 20090716 |
| Location | Bellingham, Wash. |
| Keywords | Quality control, Optical measurements |