| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Michael J. W. Chen |
| Title | Automated Inspection and High-Speed Vision Architectures III: 6-7 November 1989, Philadelphia, Pennsylvania |
| Publisher | Spie |
| Year | 1990 |
| Languages | eng |
| Isbn | 0819402362 |
| Series | SPIE Proceedings |
| Volume | 1197 |
| Description | vii, 310 p. ill. 28 cm. |
| Record date | 20090826 |
| Location | Bellingham, Wash., USA |
| Keywords | Quality control, Computer vision |